- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 15/04 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
Patent holdings for IPC class G01B 15/04
Total number of patents in this class: 336
10-year publication summary
|
22
|
11
|
23
|
32
|
25
|
27
|
36
|
32
|
27
|
6
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hitachi High-Technologies Corporation | 2034 |
61 |
| Hitachi High-Tech Corporation | 4424 |
49 |
| KLA Corporation | 1223 |
10 |
| Nikon Corporation | 7162 |
9 |
| Vega Grieshaber KG | 690 |
8 |
| Kioxia Corporation | 9847 |
8 |
| Wadeco Co., Ltd. | 16 |
6 |
| Applied Materials, Inc. | 16587 |
5 |
| Tokyo Electron Limited | 11599 |
5 |
| Volume Graphics GmbH | 79 |
5 |
| Werth Messtechnik GmbH | 59 |
5 |
| Tsinghua University | 5426 |
4 |
| Vayyar Imaging Ltd. | 150 |
4 |
| International Business Machines Corporation | 60644 |
3 |
| Applied Materials Israel, Ltd. | 549 |
3 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
3 |
| Omron Corporation | 6968 |
3 |
| FEI Company | 851 |
3 |
| Hexagon Metrology, Inc. | 149 |
3 |
| Marel Iceland ehf | 56 |
3 |
| Other owners | 136 |